Morphology Control of Carbon Nanotubes through Focused Ion Beams

This research demonstrates the capability of controlled, focused ion beam (FIB)–assisted tailoring of morphologies in both multiwall carbon nanotubes (CNTs) and Y junction nonlinear CNT systems through defect engineering. We have shown that a 30 keV FIB Ga ion beam at low ion milling currents of 1 pA can be used to partially reduce the CNT diameter, to provide electrical conduction bottleneck morphologies for linear CNTs, and to introduce both additive and subractive defects at Y junction locations of Y-CNT samples. Our aim is for this work to provide motivation for additional research to determine the effects of ion-beam-induced changes in modulating the physical and chemical properties of nanotubes.